Abstract: This letter reveals the effect of the reverse-recovery current of a PIN diode on the surge and gate-noise voltages of an insulated-gate bipolar transistor ...
Abstract: Soft errors induced by Single Event Transient (SET) or Single Event Upset (SEU) are a great threat to integrated circuits. To reduce the error rate and ...
WASHINGTON — The Army is preparing to roll out a major update to the Army Recovery Care Program (ARCP), reshaping how the service supports wounded, ill and injured Soldiers in a way leaders say ...
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